Olympus Vanta iX In-Line XRF Analyzer
Olympus Vanta iX In-Line XRF Analyzer gives you confidence in your products by automating material analysis and alloy identification on the manufacturing line:
– Delivers instant results for real-time process monitoring and 100% inspection
– Built to operate 24/7
– Configured to deliver pass/fail results, accurate grade ID, and material chemistry
Scanning and Monitoring for Ore Grade Control in Mining
For geological processing and mining, the Vanta iX analyzer enables core scanning and on-belt analysis with real-time results to monitor process variability and ensure ore grade consistency. During on-belt analysis, the analyzer provides blending verification and process validation of concentrates.
Powerful processing
With a silicon drift detector (SDD) and Olympus’ proven Axon Technology™, the analyzer can test a wide range of alloy and metal grades—including light elements. It brings the same high-count rate and stability as the rest of the Vanta series.
Intelligent integration
The Vanta iX analyzer is easy to install in manufacturing environments—use the mounting holes on each side to mount the analyzer onto robotics and other systems.
Modern data transfer
Easily control the analyzer with either the Vanta Connect API or a PLC and discrete wire. Connector options include Ethernet (RJ-45) for Power over Ethernet, USB, Discrete I/O (16 pins), and AUX DC power.
Rugged for the manufacturing line
Built to endure the high levels of vibration, electromagnetic and acoustical noise, dust, and moisture of production facilities, the analyzer is vibration tested (MIL-STD-810G), IP54 rated and designed to operate from –10 °C to 50 °C (14 °F to 122 °F) with continuous testing. A built-in heat sink lowers the internal temperature, while fan attachment points are available if extra cooling is needed. The analyzer offers toolless window changes for fast maintenance.
