Bruker S1 Turbo SD-LE Portable XRF Spectrometer
The improved resolution and count rate provides lower detection limits for all elements analyzed. Combine that with an extensive Alloy grade library and you have one of the most powerful handheld analyzers currently available on the market.
The benefits at a glance
• Supports many calibrations and applications, including PMI, Scrap metal sorting and Mining & Exploration
• The first ever SDD-based handheld analyzer
• Superior count rates and resolution (compared to previous generation SiPin instruments)
• Five times faster than previous generations
• Lower detection limits
• Grade library includes low alloy steel, tool steel, stainless steel, nickel alloys, cobalt alloys, copper alloys, aluminum alloys, titanium alloys, zirconium alloys and tungsten alloys
• Easy analysis of light elements, such as magnesium, aluminum and silicon, without the need for vacuum or helium atmosphere (S1 TURBO SD LE only)
Clarity and usability
We believe the best technology should be intuitive and instinctive to use. Every element of the S1 TURBOSD has been designed with this in mind. The bright display makes it easy to read in any lighting conditions. The touch screen means you can operate the whole machine with one finger, whether inputting a password or pulling the trigger. The operating system is Microsoft Windows – so well known that it’s almost universal. Data transfer options include Microsoft ActivSync via USB cable or wireless Bluetooth connection, as well as using an SD card. Built-in memory also makes it possible to store thousands of spectra and millions of results safely.
General Bruker S1 Turbo SD-LE
Manufacturer |
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Bruker Corporation |
Product Name |
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S1 Turbo SD-LE |
Detection Category |
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Chemical; Explosives |
Detection Principle |
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Elemental Analysis; |
Detection Method |
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X-ray Fluorescence ; |
Application |
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Emergency Response; Screening; Bulk Analysis; |
Equipment Type |
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Instrument |
Product Synopsis |
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The Bruker S1 Turbo SD-LE Portable XRF Spectrometer based on Bruker’s proprietary X-Flash® silicon drift detector (SDD) provides rapid alloy analysis and light element analysis. Provides analysis of light elements, such as magnesium, aluminum and silicon, without the need for vacuum or helium atmosphere (S1 TURBOSD LE only). |
Availability |
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DISCONTINUED |
Technology Readiness Level (TRL) |
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9 |
User Feedback Sources |
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Indifferent/No user feedback |
Physical Parameters
Dimensions |
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11.8 x 3.9 x 11 in (300 x 100 x 280 mm) |
Weight |
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<5 Lbs.; 4.49 Lbs. (2 kg) with batteries 3.9 Lbs. (1.77 kg) without Bruker S1 Turbo SD-LE Pbatteries |
Power Requirements |
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Lithium Battery; AC/DC Line Power; Li-ion (6 hr. operating time) AC Adapter: Optional |
Noise Produced |
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Negligible |
Logistical Parameters
Transportability |
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Handheld |
Ruggedness |
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None; Not militarized, drop sensitive |
Operating Conditions |
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–10 to 50°C (14 to 122°F) |
Consumables |
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None |
Solvents/Reagents |
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None |
Calibration Schedule |
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Factory calibrated with 31 or 36 elements |
Communications Interface |
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ActiveSync via USB or wireless Bluetooth Memory Card |
Shelf Life |
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>5 years |
Operational Parameters
Other Chemical Targets |
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Elemental analysis |
Adaptability |
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No; cannot detect or add new targets |
Sample Introduction |
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Solid |
Start Up Time (From Cold Start To Sample Ready) |
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15 minutes |
Response Time (Sample Application To Output) |
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<5 minutes; 2 minutes |
Alarm Capability |
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Pass/Fail option |
Software Control |
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Yes |
Other Operational Parameters |
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10 mm2 X-Flash SDD Detector, Peltier cooled; typical resolution 145 eV @ 100,000 cps X-ray tube with Ag target |